Proceedings of the European Microbeam Analysis Society (EMAS)VAN'T DACK, L; GIJBELS, R; WALKER, C. T et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, issn 0026-3672, 201 p.Conference Proceedings

Chemical and microstructural characterization of natural hydroxyapatite derived from pig bonesJANUS, Anna Maria; FARYNA, Marek; HABERKO, Krzysztof et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 349-353, issn 0026-3672, 5 p.Conference Paper

Applications of microanalysis in the cultural heritage fieldJOOSTEN, Ineke.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 295-299, issn 0026-3672, 5 p.Conference Paper

First X-ray fluorescence excited Kossel diffraction in SEMLANGER, Enrico; HASCHKE, Michael; DÄBRITZ, Siegfried et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 455-458, issn 0026-3672, 4 p.Conference Paper

Virtual standard for wavelength-dispersive electron-probe microanalysisMERLET, Claude; LLOVET, Xavier; DUGNE, Olivier et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 427-432, issn 0026-3672, 6 p.Conference Paper

Application of EPMA and analytical TEM to brazed metal-supported catalytic convertersRICHTER, Silvia; BODE, Hans; DIMYATI, Arbi et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 405-411, issn 0026-3672, 7 p.Conference Paper

Soluble fraction of stabilising elements in ferritic stainless steelALMAGRO, Juan F; LLOVET, Xavier; AUXILIADORA HEREDIA, M et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 323-327, issn 0026-3672, 5 p.Conference Paper

Monte Carlo calculations in X-ray microanalysis of epitaxial layersPOPOVA, Tatiana B; FLEGONTOVA, Ekaterina Yu; BAKALEINIKOV, Leonid A et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 459-463, issn 0026-3672, 5 p.Conference Paper

New model ultra-soft X-ray spectrometer for microanalysisFUKUSHIMA, Sei; KIMURA, Takashi; OGIWARA, Toshiya et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 399-404, issn 0026-3672, 6 p.Conference Paper

SIMS analysis of chlorine in metasomatised upper-mantle rocksOTTOLINI, Luisa P; LE FEVRE, Brieuc.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 329-336, issn 0026-3672, 8 p.Conference Paper

A SIMS study of lithium, boron and chlorine in basalts from Reykjanes (southwestern Iceland)RAFFONE, Nicola; OTTOLINI, Luisa; TONARINI, Sonia et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 307-312, issn 0026-3672, 6 p.Conference Paper

Application of EPMA and XRF for the investigation of particulate pollutants in the field of cultural heritageKONTOZOVA-DEUTSCH, Velichka; DEUTSCH, Felix; GODOI, Ricardo H. M et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 465-469, issn 0026-3672, 5 p.Conference Paper

Applications of focused ion beam SIMS in materials scienceMCPHAIL, David S; CHATER, Richard J; LIBING LI et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 387-397, issn 0026-3672, 11 p.Conference Paper

Investigation of InxGa1-xN layers by local methodsDOMRACHEVA, Yana V; BAKALEINIKOV, Leonid A; FLEGONTOVA, Ekaterina Yu et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 371-375, issn 0026-3672, 5 p.Conference Paper

Electron beam and Mössbauer techniques combined to optimise base metal partitioning in the furnaceANDREWS, Lesley; PISTORIUS, Chris P; WAANDERS, Frans B et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 445-450, issn 0026-3672, 6 p.Conference Paper

Model-based quantification of EELS : is standardless quantification possible?VERBEECK, Jo; BERTONI, Giovanni.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 439-443, issn 0026-3672, 5 p.Conference Paper

Multilayers for light element electron probe microanalysisREED, Stephen J. B.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 433-437, issn 0026-3672, 5 p.Conference Paper

Volume and composition surface changes in alkali silicate glass irradiated with electronsJUREK, Karel; GEDEON, Ondrej.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 377-380, issn 0026-3672, 4 p.Conference Paper

X-ray fluorescence as an additional analytical method for a scanning electron microscopePROCOP, Mathias; HODOROABA, Vasile-Dan.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 413-419, issn 0026-3672, 7 p.Conference Paper

About the N-series X-ray lines in the electron excited spectra of heavy elementsSCHEFFEL, Andy; DELLITH, Jan; WENDT, Michael et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 471-473, issn 0026-3672, 3 p.Conference Paper

Block lift-out sample preparation for 3D experiments in a dual beam focused ion beam microscopeSCHAFFER, Miroslava; WAGNER, Julian.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 421-425, issn 0026-3672, 5 p.Conference Paper

Light elements microanalysis of steel/B₄C melts for nuclear power plants accident studiesSAO JOAO, Sergio; DURIEZ, Christian; DOMINGUEZ, Cristina et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 343-348, issn 0026-3672, 6 p.Conference Paper

Study of structural material resulting from the nuclear fuel cycle using SEM-WDX, EPMA and SIMS techniquesLAMONTAGNE, Jérome; EYSSERIC, Catherine; DESGRANGES, Lionel et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 355-362, issn 0026-3672, 8 p.Conference Paper

Combined SEM-EDX and μ-Raman spectroscopy for the characterisation of glass/Al-rich refractory interfacesFALCONE, Roberto; GALINETTO, Pietro; MESSIGA, Bruno et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 381-386, issn 0026-3672, 6 p.Conference Paper

Analysis of ultra light elements with newly developed ultra-soft X-ray spectrometer for electron probe microanalysisOGIWARA, Toshiya; KIMURA, Takashi; FUKUSHIMA, Sei et al.Mikrochimica acta (1966. Print). 2008, Vol 161, Num 3-4, pp 451-454, issn 0026-3672, 4 p.Conference Paper